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Semiconductor Engineering: Observability Is Essential For Modern Silicon

8.14.2026

Originally published on Semiconductor Engineering by Ann Mutschler | May 28, 2026.

Semiconductor Engineering opens its Experts At The Table roundtable on in-silicon observability with Satish Radhakrishnan, head of GTM at Vinci, alongside panelists from Arteris, Baya Systems, Cadence, Keysight EDA, Movellus, Siemens EDA, and Synopsys. Part one examines why on-die visibility belongs in designs today, and how the considerations differ across chips, chiplets, and full systems.

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What does this article cover?

The panel makes the case for on-die visibility across AI, automotive, aerospace, and advanced packaging, where reliability, safety, security, and traceability all depend on knowing what silicon is actually doing in the field. Radhakrishnan focuses on heterogeneous integration: today’s 2.5D and 3D packages combine chiplets, GPUs, and HBM sourced from different companies, each designed independently, and when those parts come together they interact in ways the individual designers never modeled.

That crosstalk between dies is why he argues teams need to predict system behavior rather than react to it — a part gets designed one way and used another, and much of the surrounding system is outside any one company’s control. Cadence’s Moshiko Emmer raises a related point on the packaging and integration side, noting that multi-physics concerns including thermal and mechanical behavior now have to be anticipated ahead of silicon rather than discovered after it.

"Ideally, you want to be in a predictive mode to see what's going to happen here."

Key takeaways from the coverage:

  • Vinci’s Satish Radhakrishnan describes heterogeneous integrated systems as inherently cross-coupled, with interactions between chips that no single vendor designed for or fully controls.
  • Predicting system-level behavior in advance, rather than diagnosing it reactively, is what makes decisions possible while there is still room to act on them.
  • Semiconductor Engineering reports that panelists see integration itself — how dies are placed side-by-side or stacked — as a growing source of multi-physics reliability risk, spanning thermal and mechanical domains.
  • On-die signals can be attenuated or averaged away as data moves from die to package to board, making granular visibility at the source difficult to reconstruct later.

How does this relate to Vinci's platform?

The panel’s framing of heterogeneous integration as a prediction problem is the same problem Vinci’s foundation model is built to solve. When dies from multiple vendors are stacked into a single package, the thermal and mechanical interactions between them are a property of the assembled system, not of any one component — and they cannot be recovered from component-level analysis or simplified geometry.

Vinci’s thermo-mechanical and thermal models run on full-resolution native designs across the whole assembly, from nanometer-scale features through package and board, producing deterministic answers about heat, stress, and warpage before the parts are built. That shifts integration risk from something teams discover in the lab to something they can reason about during design.


About Vinci

Vinci is a frontier lab building the foundation model for the physical world. Its deterministic, solver-grounded systems make physics continuously computable inside production engineering workflows and are already running on flagship programs, shifting physics from an episodic simulation bottleneck to continuous infrastructure for design, manufacturing, and reliability decisions.

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